The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Sep. 13, 2016
Applicant:

Macau University of Science and Technology, Taipa, MO;

Inventors:

Naiqi Wu, Taipa, MO;

Fajun Yang, Taipa, MO;

Yan Qiao, Taipa, MO;

Mengchu Zhou, Taipa, MO;

Zhiwu Li, Taipa, MO;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/677 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67167 (2013.01); G05B 19/41865 (2013.01); H01L 21/67745 (2013.01); G05B 2219/32165 (2013.01); G05B 2219/45031 (2013.01); Y10S 901/41 (2013.01);
Abstract

A system and method of controlling a cluster tool apparatus, wherein the cluster tool includes one or more processing modules and a robot that is configured to move a semiconductor product to and from the one or more processing modules, the cluster tool configured for processing semiconductor products. The method of controlling the cluster tool apparatus to perform a processing cycle includes receiving a plurality of system parameters from a user interface, wherein the system parameters relate to one or more processing steps of the processing cycle, determining a schedule for performing the processing cycle utilizing the one or more processing modules, wherein the schedule being determined based on a semiconductor product residency parameter.


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