The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Mar. 22, 2019
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventors:

Makoto Senoo, Kanagawa, JP;

Naoaki Sudo, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/16 (2006.01); G11C 7/04 (2006.01); G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 16/08 (2006.01); G11C 16/24 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/16 (2013.01); G11C 7/04 (2013.01); G11C 16/0483 (2013.01); G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01); G11C 16/26 (2013.01); G11C 16/3445 (2013.01); G11C 16/3459 (2013.01);
Abstract

A semiconductor memory device improving a high-temperature data retention is provided. Here, a flash memory includes an erasing element erasing a selected storage cell in a storage cell array. The erasing element further includes an applying element, a verifying element, and a decision element. The applying element applies a monitoring erasing pulse to a monitoring storage cell before starting an erasing operation for selecting the storage cell. The verifying element performs a verification of the monitoring storage cell to which the monitoring erasing pulse is applied. The decision element determines ISPE conditions based on a verification result of the verifying element. The erasing element erases the storage cell according to the determined ISPE conditions.


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