The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Jul. 07, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Bing Dang, Chappaqua, NY (US);

Yang Liu, Ossining, NY (US);

Steven L. Wright, Cortlandt Manor, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/0478 (2006.01); A61N 1/04 (2006.01); A61N 1/05 (2006.01); G16H 40/67 (2018.01); G01R 3/00 (2006.01); A61B 5/00 (2006.01); A61B 5/0408 (2006.01); C25D 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0478 (2013.01); A61B 5/0022 (2013.01); A61B 5/6833 (2013.01); A61B 5/6839 (2013.01); A61N 1/0492 (2013.01); A61N 1/0502 (2013.01); G01R 3/00 (2013.01); G16H 40/67 (2018.01); A61B 5/0408 (2013.01); A61B 2562/028 (2013.01); A61B 2562/0215 (2017.08); A61B 2562/125 (2013.01); C25D 1/003 (2013.01);
Abstract

An apparatus includes a substrate mechanically and electrically connected on one side of the substrate to multiple metallic probes in one or more arrays and includes the multiple metallic probes in the one or more arrays. In a method, multiple pits may be formed in an array on a first substrate. The pits have a pyramidal shape. A release layer is formed on the first substrate and covers surfaces of the pits. Probe tips are formed in the pits on the first substrate. The probe tips are formed from rigid conductive material. Multiple pillars are formed from rigid conductive material. The pillars are electrically and mechanically connected to a second substrate and to the probe tips. Release is caused of the probe tips from the first substrate, wherein the pillars and probe tips are connected to the second substrate and together form an array of rigid and conductive probes.


Find Patent Forward Citations

Loading…