The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Oct. 25, 2018
Applicant:

Sumitomo Electric Device Innovations, Inc., Yokohama-shi, JP;

Inventors:

Takeshi Irie, Yokohama, JP;

Kei Arakawa, Yokohama, JP;

Katsuyuki Takahashi, Yokohama, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); H04J 14/02 (2006.01); H04B 10/073 (2013.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/0731 (2013.01); H04J 14/02 (2013.01);
Abstract

Test equipment that is able to concurrently evaluate two or more optical modules each processing a wavelength multiplexed signal that multiplexes optical signals attributed to wavelengths different from each other. The test equipment provides a first test station and a second test station. After selecting one of the wavelengths, the first test station performs a first evaluation for an optical signal attributed to the one of the wavelengths and coming from the first optical module, and the second station concurrently performs a second evaluation for an optical single with the one of the wavelengths and coming from the second optical module. Thereafter, the first test station performs the first evaluation for the optical signal coming from the second optical module, while, the second test station performs the second evaluation for the optical signal coming from the first optical module.


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