The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Oct. 18, 2018
Applicant:

Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, CN;

Inventor:

Xianzhou Liu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H01L 21/311 (2006.01); H01L 29/08 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66681 (2013.01); H01L 21/266 (2013.01); H01L 21/26513 (2013.01); H01L 21/31111 (2013.01); H01L 21/31116 (2013.01); H01L 29/086 (2013.01); H01L 29/0865 (2013.01); H01L 29/0878 (2013.01); H01L 29/0882 (2013.01);
Abstract

A method for manufacturing the semiconductor structure, including: providing a substrate including a first doping region, wherein a field oxide film is disposed on a top surface of the first doping region, a first pattern layer is disposed on a top surface of the field oxide film, and the first pattern layer exposes a portion of the top surface of the field oxide film; etching the field oxide film with the first pattern layer as a mask until a top surface of the substrate is exposed; forming a second doping region in the first doping region with the first pattern layer and the field oxide film as a mask; and forming a plurality of gate structures on a portion of a top surface of the second doping region, a spacer of the field oxide film and a portion of the top surface of the field oxide film.


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