The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2020

Filed:

Mar. 08, 2019
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventor:

Ming-Shing Chen, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3105 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31055 (2013.01); H01L 21/02065 (2013.01); H01L 21/02532 (2013.01);
Abstract

A planarization process includes the following steps. A first dielectric layer and a second dielectric layer are sequentially formed to conformally cover a pattern in a cell area and a substrate in the cell area and an isolation area, thereby the first dielectric layer and the second dielectric layer having a dishing in the isolation area. A dummy material is formed in the dishing and exposes a part of the second dielectric layer right above the pattern. A first removing process is performed to remove the exposed part of the second dielectric layer. The dummy material is removed. A second removing process is performed to remove an exposed part of the first dielectric layer by using the second dielectric layer as an etch stop layer. A third removing process is performed to remove the second dielectric layer and the first dielectric layer.


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