The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Apr. 05, 2018
Mitutoyo Corporation, Kanagawa, JP;
Johannes Anna Quaedackers, Veldhoven, NL;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
Method and system for calculating a height map of a surface of an object from an image stack in scanning optical 2.5D profiling of the surface by an optical system, a focal plane is scanned at different height positions with respect to the object surface. An image is captured at each height position of the focal plane to form the image stack. The scanning of the focal plane comprises long range sensing and short range sensing a displacement of the focal plane for sensing low and high spatial frequency components. The height position of the focal plane is estimated by combining the low and high spatial frequency components. A height position of each image in the image stack is calculated, based on the estimated height position of each respective focal plane. The images of the image stack are interpolated to equidistant height positions for obtaining a corrected image stack.