The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Aug. 24, 2015
Applicant:
Duke University, Durham, NC (US);
Inventors:
Hai Yan, Durham, NC (US);
Yiping He, Durham, NC (US);
Rui Yang, Durham, NC (US);
Bill H. Diplas, Durham, NC (US);
Landon Hansen, Durham, NC (US);
Darell Bigner, Durham, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6886 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6886 (2013.01); C12Q 2600/156 (2013.01); C12Q 2600/158 (2013.01); C12Q 2600/16 (2013.01); C12Q 2600/166 (2013.01);
Abstract
Methods that rapidly, sensitively, and specifically detect mutations in IDH1/2 and the TERT promoter employ amplification of particular portions of the genes that experience frequent and exquisitely localized mutations. The ability to distinguish between sequences that differ only by one nucleotide and which may be present in very low ratios is essential for such an assay.