The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2020
Filed:
Nov. 13, 2018
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventor:
Dirk Preikszas, Oberkochen, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/10 (2006.01); H01J 37/26 (2006.01); H01J 37/28 (2006.01); H01J 37/147 (2006.01); H01J 37/22 (2006.01);
U.S. Cl.
CPC ...
H01J 37/1471 (2013.01); H01J 37/10 (2013.01); H01J 37/222 (2013.01); H01J 37/265 (2013.01); H01J 37/28 (2013.01); H01J 2237/1501 (2013.01);
Abstract
A method of adjusting a particle beam microscope includes measures A, B, C and D.
Quick Actions:
Preikszas, Dirk. (2020). Method for adjusting a particle beam microscope (U.S. Patent No. 10629404). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10629404
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile