The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2020

Filed:

Aug. 30, 2018
Applicant:

Xilinx, Inc., San Jose, CA (US);

Inventors:

Kaushik Barman, Hyderbad, IN;

Parag Dighe, Hyderabad, IN;

Baris Ozgul, Dublin, IE;

Sneha Bhalchandra Date, Santa Clara, CA (US);

Assignee:

XILINX, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/26 (2006.01); G01R 19/25 (2006.01); G01R 19/04 (2006.01);
U.S. Cl.
CPC ...
H04L 27/2614 (2013.01); G01R 19/04 (2013.01); G01R 19/2509 (2013.01);
Abstract

Techniques related to a data processing engine for an integrated circuit (IC) are described. In an example, a method is provided for vectorized peak detection. The method includes dividing a set of data samples of a data signal, corresponding to a peak detection window (PDW), into a plurality of subsets of data samples each comprising a number of data samples. The method includes performing vector operations on each of the plurality of subsets of data samples. The method includes determining a running index of a sample with a maximum amplitude over the PDW based on the vector operations.


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