The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Mar. 25, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Daniel J. Mirota, San Jose, CA (US);

Samer S. Barakat, Santa Clara, CA (US);

Haowei Liu, Santa Clara, CA (US);

Duc Q. Pham, San Jose, CA (US);

Mohamed Selim Ben Himane, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/204 (2018.01); H04N 13/257 (2018.01); G06T 7/70 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/204 (2018.05); G06T 7/593 (2017.01); G06T 7/70 (2017.01); H04N 13/257 (2018.05); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Methods, apparatuses and systems may provide for conducting a quality assessment of a depth localization mode, a color localization mode and an inertia localization mode, and selecting one of the depth localization mode, the color localization mode or the inertia localization mode as an active localization mode based on the quality assessment. Additionally, a pose of a camera may be determined relative to a three-dimensional (3D) environment in accordance with the active localization mode.


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