The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Aug. 01, 2018
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventors:

Bart J. van Schravendijk, Palo Alto, CA (US);

Awnish Gupta, Hillsboro, OR (US);

Patrick A. van Cleemput, West Linn, OR (US);

Jason Daejin Park, Lake Oswego, OR (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 27/11556 (2017.01); G11C 16/04 (2006.01); H01L 27/11575 (2017.01); H01L 27/11582 (2017.01);
U.S. Cl.
CPC ...
H01L 27/11556 (2013.01); G11C 16/0408 (2013.01); G11C 16/0466 (2013.01); H01L 27/11575 (2013.01); H01L 27/11582 (2013.01);
Abstract

Methods and apparatuses for selectively depositing silicon nitride (SiN) via high-density plasma chemical vapor deposition (HDP CVD) to form a SiN pad on an exposed flat surface of a nitride layer in a 3D NAND staircase structure with alternating oxide and nitride layers are provided. In some embodiments, selective etching is performed to remove undesirable buildup of SiN on sidewalls of the oxide layers of the staircase structure. Nitride layers of the staircase structure are replaced with tungsten (W) to form tungsten wordlines, while the SiN pads are replaced with tungsten to from landing pads, which prevent punchthrough of the tungsten wordlines on the staircase structure by interconnects extending thereto.


Find Patent Forward Citations

Loading…