The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2020
Filed:
Oct. 18, 2018
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Stefan Dietrich, Turkenfeld, DE;
Wolfgang Spirkl, Germering, DE;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/38 (2006.01); G11C 29/18 (2006.01); G11C 29/36 (2006.01); G11C 7/10 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 7/1084 (2013.01); G11C 29/028 (2013.01); G11C 29/1201 (2013.01); G11C 29/18 (2013.01); G11C 29/36 (2013.01); G11C 7/1057 (2013.01);
Abstract
Apparatuses and methods are provided for a high speed writing test mode for memories. An example apparatus includes a memory core, a data terminal coupled to a data receiver, a read buffer coupled between the data terminal and the memory core, and a write buffer coupled between the data receiver and the memory core. The write buffer may include at least a first input coupled to the data receiver, and a second input. While in a test mode, the write buffer may be loaded with data from the second input instead of the first input.