The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Apr. 04, 2017
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Kazuto Akagi, Tokyo, JP;

Naoyuki Kishikawa, Tokyo, JP;

Masahiro Kawai, Tokyo, JP;

Yuji Ariyoshi, Tokyo, JP;

Assignee:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 5/00 (2006.01); G01F 1/64 (2006.01); G01F 1/684 (2006.01); F02M 35/10 (2006.01); G01F 15/18 (2006.01);
U.S. Cl.
CPC ...
G01F 5/00 (2013.01); F02M 35/10386 (2013.01); G01F 1/64 (2013.01); G01F 1/6842 (2013.01); G01F 1/6845 (2013.01); G01F 15/185 (2013.01);
Abstract

A flow measuring device includes a sub-bypass passage arranged to precede a bypass passage which is linked to a flow detecting element. Bypass passage wall surfaces, which are positioned adjacent the sub-bypass passage, are inclined toward a direction of a sub-inflow opening, and an inner-circumference-side wall surface and an outer-circumference-side wall surface of the sub-bypass passage are inclined toward a direction of a sub-outflow opening. The described structure minimizes variations in the size of the bypass passage due to build-up of foreign material, and results in a more stable flow velocity of measured fluid past the flow detecting element.


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