The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Jan. 12, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jin Sub Lee, Suwon-si, KR;

Han Kyu Seong, Seoul, KR;

Yong Il Kim, Seoul, KR;

Sung Hyun Sim, Uiwang-si, KR;

Dong gun Lee, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01L 21/683 (2006.01); H01L 23/00 (2006.01); H01L 21/67 (2006.01); H01L 33/00 (2010.01); H01L 33/62 (2010.01); H01L 25/075 (2006.01); H01L 21/66 (2006.01); B23K 26/00 (2014.01);
U.S. Cl.
CPC ...
H01L 21/6835 (2013.01); H01L 21/67092 (2013.01); H01L 21/67115 (2013.01); H01L 21/67144 (2013.01); H01L 21/67271 (2013.01); H01L 21/67288 (2013.01); H01L 22/20 (2013.01); H01L 24/81 (2013.01); H01L 25/0753 (2013.01); H01L 33/0079 (2013.01); H01L 33/0095 (2013.01); H01L 33/62 (2013.01); B23K 26/00 (2013.01); H01L 22/14 (2013.01); H01L 24/16 (2013.01); H01L 33/00 (2013.01); H01L 2221/68322 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/68354 (2013.01); H01L 2221/68363 (2013.01); H01L 2221/68381 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/81224 (2013.01); H01L 2224/81801 (2013.01); H01L 2924/12041 (2013.01); H01L 2933/0066 (2013.01);
Abstract

A chip mounting method includes providing a first substrate including a light transmissive substrate having first and second surfaces, a sacrificial layer provided on the first surface, and a plurality of chips bonded to the sacrificial layer, obtaining first mapping data by testing the chips, the first mapping data defining coordinates of normal chips and defective chips among the chips, disposing a second substrate below the first surface, disposing the normal chips on the second substrate by radiating a first laser beam to positions of the sacrificial layer corresponding to the coordinates of the normal chips, based on the first mapping data, to remove portions of the sacrificial layer thereby separating the normal chips from the light transmissive substrate, and mounting the normal chips on the second substrate by radiating a second laser beam to a solder layer of the second substrate.


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