The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Mar. 24, 2015
Educational Testing Service, Princeton, NJ (US);
Patrick Charles Kyllonen, Lawrenceville, NJ (US);
Lei Chen, Pennington, NJ (US);
Michelle Paulette Martin, Princeton Junction, NJ (US);
Isaac Bejar, Hamilton, NJ (US);
Chee Wee Leong, Levittown, PA (US);
Joanna Gorin, Newtown, PA (US);
David Michael Williamson, Yardley, PA (US);
Educational Testing Service, Princeton, NJ (US);
Abstract
Systems and methods described herein utilize supervised machine learning to generate a model for scoring interview responses. The system may access a training response, which in one embodiment is an audiovisual recording of a person responding to an interview question. The training response may have an assigned human-determined score. The system may extract at least one delivery feature and at least one content feature from the audiovisual recording of the training response, and use the extracted features and the human-determined score to train a response scoring model for scoring interview responses. The response scoring model may be configured based on the training to automatically assign scores to audiovisual recordings of interview responses. The scores for interview responses may be used by interviewers to assess candidates.