The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Oct. 27, 2017
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Subhadip Kundu, Bangalore, IN;
Parthajit Bhattacharya, Bangalore, IN;
Rohit Kapur, Cupertino, CA (US);
Assignee:
Synopsys, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318342 (2013.01); G01R 31/318364 (2013.01); G01R 31/318566 (2013.01); G06F 17/5022 (2013.01);
Abstract
Information is received describing test response signals generated by scan cells of an integrated circuit and physical shift failures representing mismatches between the test response signals and expected test response signals of the integrated circuit. The test response signals are mapped to a subset of the scan cells associated with the physical shift failures. Fault simulation is performed for the mapped subset of the scan cells to identify physical faults located within the integrated circuit causing the physical shift failures.