The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Sep. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Stephen Peter Ayotte, Essex Junction, VT (US);

Michael Russell Uy Gonzales, Quezon Province, PH;

Mark Tiam Weng Lam, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01); G01R 31/02 (2006.01); G01R 31/28 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/041 (2013.01); G01R 31/025 (2013.01); G01R 31/048 (2013.01); G01R 31/2896 (2013.01); H01L 24/78 (2013.01); H01L 24/85 (2013.01); H01L 2224/78901 (2013.01); H01L 2224/859 (2013.01); H01L 2924/00014 (2013.01); H01L 2924/3862 (2013.01);
Abstract

Quality control testing for a batch of electronic modules. A series of tests are performed on manufactured electronic modules, including tests sensitive to the failure rate of previously tested modules. Specifically, a first test comprised of two phases is performed on the module batch. Further screening is then performed responsive to detection of a wire sweep failure in a subset of failed modules from the first test phase. The further screening is on modules that passed the first test phase and excludes modules that failed the first test phase.


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