The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2020

Filed:

Apr. 16, 2019
Applicants:

Philip Teague, Houston, TX (US);

Melissa Spannuth, Houston, TX (US);

Inventors:

Philip Teague, Houston, TX (US);

Melissa Spannuth, Houston, TX (US);

Assignee:

Visuray Intech Ltd (BVI), Road Town, Tortola, VG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/00 (2012.01); H01J 35/02 (2006.01); H01J 35/32 (2006.01); G01V 5/12 (2006.01); G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
E21B 47/0002 (2013.01); G01N 23/203 (2013.01); G01V 5/12 (2013.01); H01J 35/02 (2013.01); H01J 35/025 (2013.01); H01J 35/32 (2013.01);
Abstract

An x-ray-based cased wellbore environment imaging tool is provided, the tool including at least an x-ray source; a radiation shield to define the output form of the produced x-rays; a direction controllable two-dimensional per-pixel collimated imaging detector array; sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based cased wellbore environment imaging tool to monitor and determine the integrity of materials within wellbore environments is also provided, the method including at least: producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from materials surrounding the wellbore; controlling two-dimensional per-pixel collimated imaging detector arrays; and converting image data from said detectors into consolidated images of the wellbore materials.


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