The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Mar. 29, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Albert Molina, Novelda, ES;

Kameran Azadet, San Ramon, CA (US);

Matteo Camponeschi, Villach, AT;

Jose Luis Ceballos, Villach, AT;

Christian Lindholm, Villach, AT;

Hundo Shin, Santa Clara, CA (US);

Martin Clara, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, unknown;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H04B 1/16 (2006.01); H04W 88/08 (2009.01);
U.S. Cl.
CPC ...
H03M 1/1009 (2013.01); H04B 1/16 (2013.01); H04W 88/08 (2013.01);
Abstract

An apparatus for calibrating a time-interleaved analog-to-digital converter including a plurality of time-interleaved analog-to-digital converter circuits is provided. The apparatus includes an analog signal generation circuit configured to generate an analog calibration signal based on a digital calibration signal representing one or more digital data sequences for calibration. The analog calibration signal is a wideband signal. Further, the apparatus includes a coupling circuit configured to controllably couple an input node of the time-interleaved analog-to-digital converter to either the analog signal generation circuit or to a node capable of providing an analog signal for digitization.


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