The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Jun. 30, 2016
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Ouriel Barzilay, Jerusalem, IL;
Jonathan Abramson, Aminadav, IL;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/536 (2017.01); G06T 7/557 (2017.01); G06T 7/143 (2017.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06T 7/536 (2017.01); G06T 7/143 (2017.01); G06T 7/521 (2017.01); G06T 7/557 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01);
Abstract
An apparatus for an electronic measurement using a single image is described herein. The apparatus includes a surface fitting mechanism that is to estimate the analytical model of a surface on which lies the point of the single image and a ray casting unit that is to cast a virtual ray at the selected point that intersects the surface. The apparatus also includes a computing unit to compute a least one three-dimensional location for the selected point based on the intersection of the virtual ray and the plane.