The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Apr. 19, 2018
Applicant:

Imec Vzw, Leuven, BE;

Inventors:

Ryan Ryoung han Kim, Bertem, BE;

Jae Uk Lee, Heverlee, BE;

Assignee:

Imec vzw, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06T 7/00 (2017.01); G06F 17/50 (2006.01); G06N 3/08 (2006.01); G03F 7/20 (2006.01); G06F 3/147 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G03F 7/70433 (2013.01); G06F 17/5072 (2013.01); G06N 3/088 (2013.01); G06T 7/0006 (2013.01); G06F 3/147 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Methods and systems for analyzing design of an integrated circuit are described. An example method includes receiving a design layout for an integrated circuit and forming a plurality of images of portions of the design layout. The method also includes, for each image of a portion of the design layout, calculating a Fourier transform representation of the image and extracting values of pre-defined parameters from the Fourier transform representation. The method also includes comparing the extracted parameter values of the plurality of images to create a clustering model by unsupervised machine learning and to sort each image of a portion of the design layout into a cluster defined by the clustering model. The method also includes determining a number of images sorted into at least one cluster defined by the clustering model.


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