The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Jun. 01, 2018
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Sandeep Jana, Bangalore, IN;
Arunava Saha, Sunnyvale, CA (US);
Pratik Mahajan, Cupertino, CA (US);
Per Bjesse, Portland, OR (US);
Alfred Koelbl, Hillsboro, OR (US);
Assignee:
Synopsis, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/504 (2013.01); G06F 17/5022 (2013.01);
Abstract
The fault analysis problem is modelled by automatically creating additional properties (fault properties) and constraints based on a plurality of injected faults and existing user assertions. These fault properties and constraints are sent to formal verification in a single run to qualify all of the faults together, rather than sequentially checking each fault in a separate formal verification run.