The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Apr. 28, 2017
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Rotem Nahum, San Jose, CA (US);

Padmaja Nalluri, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/273 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G11C 29/56 (2013.01);
Abstract

A system for performing an automated test is disclosed. The method comprises programming a application programming interface (API) to control a default production flow on a tester, wherein the production flow comprises a plurality of test sequences associated with executing tests on devices under test (DUTs) connected to the tester. The method further comprises configuring the API to modify the default production flow to customize the plurality of test sequences in accordance with a user-specific API, wherein the user-specific API comprises a modification to the production flow in accordance with testing requirements of a user. Finally, the method comprises integrating the user-specific API with the API to customize the API for the user.


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