The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2020
Filed:
Nov. 27, 2017
Vmware, Inc., Palo Alto, CA (US);
Paul Pedersen, Palo Alto, CA (US);
Darren Brown, Seattle, WA (US);
Wei Li, Palo Alto, CA (US);
Leah Nutman, Palo Alto, CA (US);
Sergio Nakai, Palo Alto, CA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
The current document is directed to methods and systems that collect metric data within computing facilities, including large data centers and cloud-computing facilities. In a described implementation, input metric data is compressed by replacing each metric data point with a one-bit, two-bit, four-bit, or eight-bit compressed data value. During a first time window following reception of a metric data point, the metric data point remains available in uncompressed form to facilitate data analysis and monitoring functionalities that use uncompressed metric data. During a second time window, the metric data point is compressed and stored in memory, where the compressed data point remains available for data analysis and monitoring functionalities that use compressed metric data for detection of peaks, periodic patterns, and other characteristics. Finally, the compressed data point is archived in mass storage, where it remains available to data-analysis and management functionalities for a lengthy time period.