The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Feb. 01, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Koichi Nishimura, Tokyo, JP;

Hiroyuki Takayama, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01); G01N 35/02 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01N 33/50 (2013.01); G01N 35/00712 (2013.01); G01N 35/00722 (2013.01); G01N 35/02 (2013.01); G01N 35/10 (2013.01); G01N 35/1079 (2013.01); B01L 2200/141 (2013.01); G01N 35/1002 (2013.01); G01N 2035/009 (2013.01);
Abstract

Provided is an automatic analyzer capable of replacing an insertion mechanism while suppressing occurrence of dispensing abnormality and analysis result abnormality accompanying deterioration of the insertion mechanism. Included are an insertion mechanism that is inserted into a closed container through a lid of the container; a storage unit that stores an insertion history count corresponding to a cumulative load of the insertion mechanism caused by inserting the insertion mechanism into a plurality of the containers, and an allowable insertion history count which is an allowable value of the insertion history count; and a control unit that compares the insertion history count with the allowable insertion history count and performs control to make a notification to an operator in a case where the insertion history count reaches the allowable insertion history count.


Find Patent Forward Citations

Loading…