The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Sep. 29, 2017
Applicant:
Tektronix, Inc., Beaverton, OR (US);
Inventors:
Michael J. Mende, Portland, OR (US);
Richard A. Booman, Lake Oswego, OR (US);
Wayne M. Wilburn, Hillsboro, OR (US);
Assignee:
Tektronix, Inc., Beaverton, OR (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01); G01R 1/067 (2006.01); H03H 1/02 (2006.01); G01R 31/319 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06766 (2013.01); G01R 1/06772 (2013.01); G01R 1/07328 (2013.01); G01R 31/31905 (2013.01); H03H 1/02 (2013.01);
Abstract
Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.