The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2020
Filed:
Jun. 14, 2017
Applicant:
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Inventors:
Shintaro Kobayashi, Akishima, JP;
Katsuhiko Inaba, Akishima, JP;
Assignee:
RIGAKU CORPORATION, Akishima-Shi, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/20008 (2018.01); G01N 23/201 (2018.01); G01C 9/00 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01C 9/00 (2013.01); G01N 23/201 (2013.01); G01N 23/20008 (2013.01); G21K 1/02 (2013.01); G01N 2223/316 (2013.01); G01N 2223/61 (2013.01);
Abstract
An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member provided with a pinhole, the pinhole allowing X-rays diffracted from the sample to pass so that the diffracted X-rays pass through the center point of the goniometer circle, and other diffracted X-rays are shielded by the pinhole member.