The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2020

Filed:

Jun. 26, 2018
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Wanghua Wu, Santa Clara, CA (US);

Chih-Wei Yao, Sunnyvale, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 5/156 (2006.01); H03L 7/099 (2006.01); H03L 7/097 (2006.01); H04L 25/49 (2006.01); H03L 7/08 (2006.01); H03L 7/091 (2006.01);
U.S. Cl.
CPC ...
H03K 5/1565 (2013.01); H03L 7/0802 (2013.01); H03L 7/091 (2013.01); H03L 7/097 (2013.01); H03L 7/0992 (2013.01); H04L 25/4902 (2013.01);
Abstract

A system and method for fast converging reference clock duty cycle correction for a digital to time converter (DTC) based analog fractional-N phase-locked loop (PLL) are herein disclosed. According to one embodiment, an electronic circuit includes a clock doubler, a comparator that outputs a value representing a difference between a voltage at a voltage-to-current (Gm) circuit and a reference voltage that is adjusted to compensate for an offset of the comparator, and a duty cycle calibration circuit that receives the value output from the comparator and adjusts a duty cycle of the PLL by extracting an error from the value output from the comparator and delaying a clock edge of the duty cycle according to the extracted error.


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