The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2020

Filed:

Dec. 27, 2018
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Nicolas Posseme, Sassenage, FR;

Sebastien Barnola, Villard Bonnot, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31116 (2013.01); H01L 29/66795 (2013.01);
Abstract

A method for etching a dielectric layer covering at least one top and at least one flank of a semi-conductive material-based structure is provided, including a plurality of sequences, each including successive steps of: a first etching of the layer by plasma using a chemistry including at least a first fluorine-based compound and a second compound chosen from SiCland SiF, w, x, y, and z being whole numbers, and oxygen, the first etching: interrupting before complete consumption of the dielectric layer thickness on the flank and after complete consumption of the thickness on the top, and forming a first protective layer on the top and a second protective layer on the flank; and a second etching fully removing the second layer while conserving a portion of the first layer thickness, each sequence being repeated until complete removal of the dielectric layer on the flank.


Find Patent Forward Citations

Loading…