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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10571674 B1

PDFFull Text
Date of Patent:
Feb. 25, 2020

Filed:

Mar. 28, 2018

3d localization microscopy and 4d localization microscopy and tracking methods and systems

Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Christian Soeller, Auckland, NZ;

David Michael Baddeley, Auckland, NZ;

Mark Bryden Cannell, Auckland, NZ;

Assignee:

Carl Zeiss Microscopy GmbH, Jena, DE;

Attorney:

Patterson Thuente Pedersen, P.A.

Primary Examiner:

William R Alexander

Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/14 (2006.01); G02B 21/16 (2006.01); G02B 27/58 (2006.01); G02B 21/00 (2006.01); G06T 7/194 (2017.01); G06T 7/73 (2017.01); H04N 13/204 (2018.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G01N 21/6458 (2013.01); G02B 21/0004 (2013.01); G02B 21/0092 (2013.01); G02B 21/14 (2013.01); G02B 21/16 (2013.01); G02B 21/36 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); G06K 9/4661 (2013.01); G06K 9/4671 (2013.01); G06K 9/6267 (2013.01); G06T 5/00 (2013.01); G06T 7/0002 (2013.01); G06T 7/194 (2017.01); G06T 7/73 (2017.01); H04N 13/204 (2018.05); H04N 17/002 (2013.01); G06K 2009/4666 (2013.01); G06T 2207/10056 (2013.01);
Abstract

A 3D localization microscopy system, 4D localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4D system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.

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