The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2020
Filed:
Jun. 03, 2016
Carl Zeiss Microscopy Gmbh, Jena, DE;
Martin Beck, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for multi-line detection, in which a number M of regions Rto be read, with m=1, . . . , M, is specified on a two-dimensional detector connected to an actuator. In each region to be read, a number J of row groups in each case of adjacent detector rows is specified, wherein each row group comprises a predefined number N of detector rows. In order to be able to record light in several areas on the detector at the same time, integration process are started successively in all participating rows and, after these have been ended, read processes are started. A read time is available for the reading of each row, this read time also corresponds to the temporal offset in which the integration processes are started row by row. An actual exposure, controlled via a corresponding signal, is effected only when integration processes have actually been started in all participating rows and the first integration process has not yet been ended again. In this way, a simultaneous detection in different areas on the sensor under identical conditions is possible.