The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Aug. 25, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventor:

Hoang Tran Van, Phoenix, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/076 (2013.01); G06F 11/0709 (2013.01);
Abstract

Certain embodiments may include a method, system, apparatus, and/or machine accessible storage medium to: obtain baseline data associated with a device, wherein the baseline data comprises an indication of an expected performance of the device during healthy operation; obtain status data associated with the device, wherein the status data is obtained based on operational information monitored by a sensor; compute delta data based on a delta between the status data and the baseline data; compute a standard deviation of the delta data; compute a plurality of standard deviation bands based on the standard deviation of the delta data; compute a statistical distribution of the delta data based on the plurality of standard deviation bands; and detect a fault in the device based on the statistical distribution of the delta data.


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