The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2020
Filed:
Feb. 01, 2019
Disco Corporation, Tokyo, JP;
Shuichiro Tsukiji, Tokyo, JP;
Yuki Ikku, Tokyo, JP;
Keiji Nomaru, Tokyo, JP;
Satoshi Kobayashi, Tokyo, JP;
DISCO CORPORATION, Tokyo, JP;
Abstract
A non-destructive detection method includes, after carrying out a preparation step of preparing an inspection apparatus, an image acquisition step of intermittently moving an objective lens by a predetermined distance in a Z-axis direction orthogonal to an X-Y plane to be made closer to a first surface, positioning a focal point to a Z-axis coordinate value where a distance of the focal point extends by a refractive index of a workpiece, acquiring an X-Y plane image of an inside of the workpiece for each of a plurality of Z-axis coordinate values, and then, recording the acquired images in a recording unit, and a modified layer detecting step of detecting a state of a modified layer from the X-Y plane image for each of the plurality of Z-axis coordinate values recorded in the recording unit.