The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Apr. 19, 2018
Applicant:

Gigaphoton Inc., Tochigi, JP;

Inventors:

Tatsuya Yanagida, Oyama, JP;

Osamu Wakabayashi, Oyama, JP;

Assignee:

Gigaphoton Inc., Tochigi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 2/00 (2006.01); H01S 3/107 (2006.01); H01S 3/223 (2006.01); H01S 3/06 (2006.01); H01S 3/11 (2006.01); H01S 3/08 (2006.01); H01S 3/23 (2006.01); H01S 3/16 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
H05G 2/008 (2013.01); H01S 3/0602 (2013.01); H01S 3/08054 (2013.01); H01S 3/107 (2013.01); H01S 3/1115 (2013.01); H01S 3/2232 (2013.01); H01S 3/2308 (2013.01); H05G 2/006 (2013.01); H01S 3/005 (2013.01); H01S 3/1611 (2013.01); H01S 3/1643 (2013.01); H01S 3/1673 (2013.01); H01S 3/235 (2013.01); H01S 3/2316 (2013.01);
Abstract

An extreme ultraviolet light (EUV) generation system is configured to improve conversion efficiency of energy of a laser system to EUV energy by improving the efficiency of plasma generation. The EUV generation system includes a target generation unit configured to output a target toward a plasma generation region in a chamber. The laser system is configured to generate a first pre-pulse laser beam, a second pre-pulse laser beam, and a main pulse laser beam so that the target is irradiated with the first pre-pulse laser beam, the second pre-pulse laser beam, and the main pulse laser beam in this order. In addition, the EUV generation system includes a controller configured to control the laser system so that a fluence of the second pre-pulse laser beam is equal to or higher than 1 J/cmand equal to or lower than a fluence of the main pulse laser beam.


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