The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2020

Filed:

Sep. 25, 2017
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventors:

Liwan Yue, Shanghai, CN;

Qiang Wu, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); H01L 23/544 (2006.01); G06T 7/13 (2017.01); B25J 9/16 (2006.01); G06T 7/00 (2017.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); H01L 21/67265 (2013.01); H01L 21/68707 (2013.01); H01L 23/544 (2013.01); B25J 9/1697 (2013.01); G06T 7/0006 (2013.01); G06T 7/13 (2017.01); G06T 2207/30148 (2013.01); H01L 2223/54426 (2013.01); H04N 5/2256 (2013.01); Y10S 901/47 (2013.01);
Abstract

A substrate alignment device includes a plurality of state detection units, each of which is configured to move from a standby position to a detection position for detecting a positional state of a substrate and return back from the detection position back to the standby position, and a multidimensional robot arm configured to receive and support the substrate, transfer the substrate to a substrate detection site, and adjust the substrate in at least one orientation or position according to the detected positional state of the substrate to position the substrate to a target position for overlay mark measurements.


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Yue, Liwan. (2020). Wafer alignment method and apparatus for overlay measurement (U.S. Patent No. 10553470). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10553470

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