The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Jul. 10, 2015
Rigaku Corporation, Akishima-shi, Tokyo, JP;
Takuto Sakumura, Hachioji, JP;
Yasukazu Nakaye, Ome, JP;
Yuji Tsuji, Hamura, JP;
Koichi Kajiyoshi, Ome, JP;
Takeyoshi Taguchi, Tachikawa, JP;
Kazuyuki Matsushita, Ome, JP;
RIGAKU CORPORATION, Tokyo, JP;
Abstract
Provided are a data processing apparatus a method of obtaining the characteristic of each pixel and a method of data processing, and a program. A data processing apparatusto correct X-ray intensity data measured by a pixel detector includes a characteristic storage unitto store the characteristic of each pixel in a specific detector, a correction table generation unitto apply a measurement condition input as that in measurement by a specific detector and a value expressing the characteristic of each pixel to an approximate formula expressing the count value of each pixel and to generate a correction table for the specific detector using the calculation result of the approximate formula, and a correction unitto correct the X-ray intensity data measured by the specific detector using the generated correction table.