The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2020

Filed:

Sep. 25, 2015
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Hidenori Fujii, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/86 (2006.01); H01L 29/868 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/868 (2013.01); H01L 29/0619 (2013.01); H01L 29/6609 (2013.01);
Abstract

The technique disclosed in the Description adjusts a modulation level to enable prevention of partial concentration of carriers in a recovery operation. A semiconductor device includes: a semiconductor layer of a first conductivity type; a first impurity layer of the first conductivity type, the first impurity layer being partially diffused in an underside of the semiconductor layer and higher in impurity concentration than the semiconductor layer; and a plurality of second impurity layers of a second conductivity type, the second impurity layers being partially diffused in a surface of the semiconductor layer, wherein the first impurity layer is formed, in a plan view, between the second impurity layers and in a position that does not overlap the second impurity layers, and only the semiconductor layer exists between the second impurity layers in the surface of the semiconductor layer.


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