The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Feb. 23, 2018
Applicant:

Veeco Precision Surface Processing Llc, Horsham, PA (US);

Inventors:

Laura Mauer, South Kent, CT (US);

John Taddei, Jim Thorpe, PA (US);

John Clark, Philadelphia, PA (US);

Kenji Nulman, Warminster, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 21/306 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); H01L 21/30604 (2013.01); H01L 21/6708 (2013.01); H01L 21/67046 (2013.01); H01L 21/67253 (2013.01); H01L 22/20 (2013.01); H01L 22/26 (2013.01);
Abstract

A system and method are provided for etching semiconductor wafers (integrated circuit substrates) with advanced packaging using a two-step wet etching process. The first etch step uses an etchant that is non-selective to at least the wafer material (silicon) and metals, such as copper and titanium, that are present in the wafer. The second etch step uses an etchant that is selective to the wafer material (silicon) and has low selectivity for the metals, thereby leaving them at least substantially intact.


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