The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Dec. 10, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kangguo Cheng, Schenectady, NY (US);

Ramachandra Divakaruni, Ossining, NY (US);

Jeehwan Kim, Cambridge, MA (US);

Juntao Li, Cohoes, NY (US);

Devendra K. Sadana, Pleasantville, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/84 (2006.01); H01L 27/12 (2006.01); H01L 27/092 (2006.01); H01L 21/8238 (2006.01); H01L 29/161 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 29/167 (2006.01); H01L 21/326 (2006.01); H01L 21/265 (2006.01); H01L 21/762 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/845 (2013.01); H01L 21/02236 (2013.01); H01L 21/02532 (2013.01); H01L 21/26506 (2013.01); H01L 21/30604 (2013.01); H01L 21/326 (2013.01); H01L 21/7624 (2013.01); H01L 21/823807 (2013.01); H01L 21/823821 (2013.01); H01L 27/0922 (2013.01); H01L 27/0924 (2013.01); H01L 27/1211 (2013.01); H01L 29/0649 (2013.01); H01L 29/161 (2013.01); H01L 29/167 (2013.01); H01L 29/785 (2013.01); H01L 29/7849 (2013.01);
Abstract

A method for forming CMOS devices includes masking a first portion of a tensile-strained silicon layer of a SOI substrate, doping a second portion of the layer outside the first portion and growing an undoped silicon layer on the doped portion and the first portion. The undoped silicon layer becomes tensile-strained. Strain in the undoped silicon layer over the doped portion is relaxed by converting the doped portion to a porous silicon to form a relaxed silicon layer. The porous silicon is converted to an oxide. A SiGe layer is grown and oxidized to convert the relaxed silicon layer to a compressed SiGe layer. Fins are etched in the first portion from the tensile-strained silicon layer and the undoped silicon layer and in the second portion from the compressed SiGe layer.


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