The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Nov. 29, 2017
Applicant:

President and Fellows of Harvard College, Cambridge, MA (US);

Inventors:

Eric Mazur, Concord, MA (US);

Michael J. Aziz, Concord, MA (US);

Hemant Gandhi, Cambridge, MA (US);

David Pastor, Cambridge, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/265 (2006.01); H01L 21/268 (2006.01); H01L 21/324 (2006.01); H01L 29/167 (2006.01); H01L 21/67 (2006.01); B23K 26/06 (2014.01); B23K 26/0622 (2014.01); H01L 29/36 (2006.01); B23K 26/352 (2014.01);
U.S. Cl.
CPC ...
H01L 21/02686 (2013.01); B23K 26/0622 (2015.10); B23K 26/0643 (2013.01); H01L 21/02381 (2013.01); H01L 21/02532 (2013.01); H01L 21/268 (2013.01); H01L 21/26513 (2013.01); H01L 21/324 (2013.01); H01L 21/67115 (2013.01); H01L 29/167 (2013.01); H01L 29/36 (2013.01); B23K 26/352 (2015.10); H01L 21/02395 (2013.01); H01L 21/02422 (2013.01);
Abstract

In one aspect a method of fabricating an n-doped strained germanium (Ge) film is disclosed, which includes depositing a strained Ge film on an underlying substrate, implanting at least one electron-donating dopant in the Ge film, and exposing the implanted Ge film to one or more laser pulses having a pulsewidth in a range of about 1 ns to about 100 ms so as to generate a substantially crystalline strained Ge film. In some embodiments, the pulses can cause melting followed by substantial recrystallization of at least a portion of the implanted Ge film. In some embodiments, the resultant Ge film can have a thickness in a range of about 10 nm to about 1 microns.


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