The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2020

Filed:

Feb. 27, 2019
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Masahiko Harumoto, Kyoto, JP;

Koji Kaneyama, Kyoto, JP;

Masaya Asai, Kyoto, JP;

Yuji Tanaka, Kyoto, JP;

Chisayo Nakayama, Kyoto, JP;

You Arisawa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03D 3/00 (2006.01); G03F 7/30 (2006.01); H01L 21/67 (2006.01); G03F 7/32 (2006.01);
U.S. Cl.
CPC ...
G03F 7/3021 (2013.01); G03F 7/32 (2013.01); H01L 21/6715 (2013.01);
Abstract

After a developing step is performed by feeding developer to the substrate, a second nozzle starts dispensation of a surfactant rinse liquid to a position away from the center of a rotating substrate. This operation is performed such that the center of the substrate does not enter into a reaching region of the substrate where the surfactant rinse liquid dispensed from the second nozzle firstly reaches. Accordingly, a point of the reaching region of the surfactant rinse liquid is dispersed, leading to suppression in locally smaller or larger line width of a resist pattern at the center and around the center of the substrate. Consequently, this achieves enhanced uniformity of the line widths of the resist pattern within a surface of the substrate during the rinse process.


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