The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2020
Filed:
May. 08, 2015
Applicants:
Arthur Freitas, Toulouse, FR;
Cedric Fau, Toulouse, FR;
Cedric Labouesse, Aucamville, FR;
Philippe Soleil, Aureville, FR;
Pascal Sandrez, Toulouse, FR;
Inventors:
Arthur Freitas, Toulouse, FR;
Cedric Fau, Toulouse, FR;
Cedric Labouesse, Aucamville, FR;
Philippe Soleil, Aureville, FR;
Pascal Sandrez, Toulouse, FR;
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2848 (2013.01);
Abstract
A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.