The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Apr. 27, 2018
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventors:

Hai Yang Zhang, Shanghai, CN;

Zhuo Fan Chen, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/11556 (2017.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/417 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66818 (2013.01); H01L 27/11556 (2013.01); H01L 29/41791 (2013.01); H01L 29/7856 (2013.01);
Abstract

Semiconductor devices and fabrication methods are provided. A fabrication method includes: forming a source and drain material layer over a substrate; forming a mask layer over the source and drain material layer and including a first trench exposing a portion of the source and drain material layer; forming a protective layer on sidewalls of the first trench; forming a second trench in the source and drain material layer using the mask layer and the protective layer as an etch mask; removing the protective layer after the second trench is formed; forming a channel material layer and a gate structure on the channel material layer after the protective layer is removed; and removing the mask layer after the channel material layer and the gate structure are formed. The channel material layer is on the sidewalls and the bottom of the first trench and the second trench.


Find Patent Forward Citations

Loading…