The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2020
Filed:
Oct. 03, 2017
Applicant:
Stmicroelectronics International N.v., Schiphol, NL;
Inventor:
Nishu Kohli, Uttar Pradesh, IN;
Assignee:
STMicroelectronics International N.V., Schiphol, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01); G11C 29/24 (2006.01); G11C 29/00 (2006.01); G11C 29/14 (2006.01); G11C 29/54 (2006.01); G11C 29/52 (2006.01); G11C 29/50 (2006.01); G11C 29/56 (2006.01); G11C 11/34 (2006.01); G11C 11/22 (2006.01); G01R 31/3183 (2006.01); G11C 11/4063 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G01R 31/318307 (2013.01); G01R 31/318371 (2013.01); G11C 11/2273 (2013.01); G11C 11/2275 (2013.01); G11C 11/34 (2013.01); G11C 11/4063 (2013.01); G11C 29/00 (2013.01); G11C 29/14 (2013.01); G11C 29/24 (2013.01); G11C 29/50 (2013.01); G11C 29/52 (2013.01); G11C 29/54 (2013.01); G11C 29/56004 (2013.01); G11C 29/56008 (2013.01); G01R 31/318342 (2013.01);
Abstract
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.