The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 2020

Filed:

Nov. 11, 2015
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Piyush Kaul, Delhi, IN;

Samer Lutfi Hijazi, San Jose, CA (US);

Raul Alejandro Casas, Doylestown, PA (US);

Rishi Kumar, Jalandhar, IN;

Xuehong Mao, San Jose, CA (US);

Christopher Rowen, Santa Cruz, CA (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

The present disclosure relates to a computer-implemented method for analyzing one or more hyper-parameters for a multi-layer computational structure. The method may include accessing, using at least one processor, input data for recognition. The input data may include at least one of an image, a pattern, a speech input, a natural language input, a video input, and a complex data set. The method may further include processing the input data using one or more layers of the multi-layer computational structure and performing matrix factorization of the one or more layers. The method may also include analyzing one or more hyper-parameters for the one or more layers based upon, at least in part, the matrix factorization of the one or more layers.


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