The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Dec. 27, 2017
Mitutoyo Corporation, Kawasaki-shi, Kanagawa-ken, JP;
Michael Nahum, Kirkland, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A first position measurement device ('FPMD') is configured to control and operate both standalone and combined device operating modes. During the combined device operating mode, the FPMD inputs second-device measurement sample outputs provided by a second position measurement device ('SPMD') via an inter-device communication connection. The FPMD and the SPMD are held in a fixed relationship in a workpiece measurement arrangement (e.g., with transverse measuring axes). Concurrent measurement data sets are determined as including at least a first-device measurement sample output from the FPMD and a second-device measurement sample output from the SPMD corresponding to concurrent first-device and second-device sample periods. Each concurrent measurement data set is associated with a corresponding measurement sample region on the workpiece. A combined measurement data output (e.g., as output and/or displayed by the FPMD) is provided for the current measurement sample region on the workpiece based on the corresponding concurrent measurement data set.