The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Aug. 31, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Tzung-Yi Tsai, Taoyuan, TW;

Yen-Ming Chen, Chupei, TW;

Tsung-Lin Lee, Hsinchu, TW;

Chih-Chieh Yeh, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 27/088 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823431 (2013.01); H01L 21/823462 (2013.01); H01L 21/823481 (2013.01); H01L 27/0886 (2013.01);
Abstract

A fin field effect transistor (FinFET) device structure with dummy fin structures and method for forming the same are provided. The FinFET device structure includes an isolation structure over a substrate and a first fin structure extended above the isolation structure. The FinFET device structure includes a second fin structure embedded in the isolation structure and a liner layer formed on sidewalls of the first fin structures and sidewalls of the second fin structures. The FinFET device structure also includes a material layer formed over the second fin structures, and the material layer and the isolation structure are made of different materials.


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