The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Oct. 26, 2016
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Katherine Chiang, New Taipei, TW;

Cheng Hsiao, Hsinchu, TW;

Chang-Yu Huang, Hsinchu County, TW;

Juan Yi Chen, Hsinchu, TW;

Ke-Wei Su, Hsinchu County, TW;

Chung-Kai Lin, Taipei, TW;

Lester Chang, Hsinchu, TW;

Min-Chie Jeng, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); G06F 17/50 (2006.01); G06F 7/58 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5068 (2013.01); G06F 7/588 (2013.01); G06F 17/5036 (2013.01);
Abstract

An integrated circuit (IC) design method includes receiving a spatial correlation matrix, R, of certain property of post-fabrication IC devices; and deriving a random number generation function g(x, y) such that random numbers for a device at a coordinate (x, y) can be generated by g(x, y) independent of other devices, and all pairs of random numbers satisfy the spatial correlation matrix R. The method further includes receiving an IC design layout having pre-fabrication IC devices, each of the pre-fabrication IC devices having a coordinate and a first value of the property. The method further includes generating random numbers using the coordinates of the pre-fabrication IC devices and the function g(x, y); deriving second values of the property by applying the random numbers to the first values; and providing the second values to an IC simulation tool.


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