The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Dec. 31, 2018
Mitutoyo Corporation, Kanagawa-ken, JP;
Joseph Daniel Tobiason, Bothell, WA (US);
Mitutoyo Corporation, Kanagawa-ken, JP;
Abstract
A method for measuring Z height values of a workpiece surface with a machine vision inspection system comprises illuminating a workpiece surface with structured light, collecting at least two stacks of images of the workpiece, each stack including a different X-Y position between the structured light and the workpiece surface at a corresponding Z height in each of the stacks, and determining Z values based on sets of intensity values of a pixel corresponding to the same workpiece position in the X-Y plane which are at the same Z heights. The X-Y position is changed at a slower rate than the Z height in each stack of images, and is changed either continuously during each of the at least two stacks at a slower rate than the Z shift, or fixed to a different value during each of the at least two stacks.